NPL Webinar on Effect of Bias on CAF Failures of Electronic Circuits

Reading time ( words)

High reliability in service is the key issue in today’s high-density electronic circuits. And the voltage applied to the electronic circuit plays a very important role in electrochemical reliability. Insulation resistance (IR) measurement has been widely used to predict and evaluate the reliability of electronic circuit. But the test voltages for existing IR measurement are only up to 300V. With the trend toward more electric vehicles, measurements need to be conducted at significantly increased voltages to understand potential new failure mechanism when using voltages up to 1,000V.

In line with this, the National Physical Laboratory will hold a webinar on July 16, 2019 to help the industry understand the effect of bias (up to 1,000V) on conductive anodic filament (CAF) failures of electronic circuits. For this webinar, NPL has commissioned a 1,000V IR test facility for demonstration.

For more information or to register, click here.



Suggested Items

How to Feed Test Data Back to Engineering for Process Improvement

08/01/2019 | Todd Kolmodin, Gardien Services
Some people think of the PCB manufacturing process as a black box: design data goes to the manufacturer (fabrication house), and magically, the finished PCB is produced. While it may have been like that in the past, in actuality, fabricating PCBs today is quite a ballet of processes.

Kelvin Characterization to Accurately Predict Copper Thickness

07/01/2019 | Article by Brandon Sherrieb, Integrated Test Corporation
A few years ago at Integrated Test Corporation, we found that the reaction plan for void fallout at electrical test was ineffective and not standardized. Like many PCB manufacturing facilities (including a Sanmina shop that I used to work at), the reaction plan consisted of cross section analysis to determine the void type.

Virtual Verification Station From CIMS Enhances AOI Capabilities

06/28/2019 | Barry Matties, I-Connect007
At this year’s CPCA Show, CIMS Marketing and Technical Director Vladi Kaplan spoke to Barry Matties about a number of add-ons CIMS designed to further enhance their AOI capabilities and systems. He described their Virtual Verification Station (VVS), CIMS Quality Center (CQC), and Software Development Kit (SDK) as well as trends he sees with laser via inspection.

Copyright © 2019 I-Connect007. All rights reserved.