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Bowman recently announced the addition of a new EU Branch. Bowman Iberica greatly expands Bowman’s reach and service capability in western Europe. From its headquarters in the Barcelona suburb of Mataro, it will serve new and existing XRF benchtop users throughout Spain and Portugal.
According to owner Domenec Mayoral, the region is ripe with potential for Bowman’s G series benchtop XRF, with its precision video imaging, and ‘bottom-up’ measurement using laser-based auto-focus. Mayoral has more than a quarter century of experience with German-made XRFs, and with Elcometer, a manufacturer of inspection equipment, and DataPhysics, a manufacturer of surface measurement instruments.
I-Connect007 Editorial Team
In this second half of our conversation, Michael Carano discusses some of the metrics that fabricators need to consider before investing in new processes, especially process control technologies, and some of the challenges board shops face updating brownfield sites.
Dan Beaulieu, D.B. Management Group
It’s always good to catch up with old friends, especially when you can start working together. I recently spoke with my friend John Johnson, who has joined American Standard Circuits as the director of business development. At ASC, John will be using the Averatek A-SAP process that he was previously involved with. He shares some of his background and provides insight on the best ways to use this semi-additive PCB fabrication process that opens the capability window for forming trace and space.
Pete Starkey, I-Connect007
Örebro, Sweden on June 15 brought a bright and early start to Day 2 of the EIPC Summer Conference for those who had enjoyed the previous evening’s networking dinner, but had resisted the temptation to over-indulge or to carry on their long-awaited catch-up conversations with old friends into the small hours. All but a few were in their seats for 9 a.m., awake and attentive for Session 4 of the conference, on the theme of new process technologies, moderated by Martyn Gaudion, CEO of Polar Instruments.