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FIB: Beyond SEM-EDS Analysis
May 2, 2013 |Estimated reading time: Less than a minute
The SEM-EDS has proven itself an invaluable tool in examining process outputs, and analyzing defects. Going beyond the SEM-EDS, the focused ion beam (FIB) can be used to qualify processes, and perform root cause failure analysis.
We authors have similar memories from our childhood, of our mothers saying something like, “If you tell a fib people will know.” Ironically, many years later, we’re using the FIB to detect process fibs.
So just what is this FIB analysis all about?
Read the full article here.This article originally appeared in the February 2013 issue of The PCB Magazine.