NPL and SMART Group to Hold Design, Process & Reliability Seminar


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The National Physical Laboratory and SMART Group will hold a seminar November 9, 2017, that will showcase the latest research and results from NPL projects looking at solder joint and contamination failure, coating thickness measurement, solder joint reliability, and high temperature reliability for alternative solders and substrates materials.

Presentations include performance and lifetime of printed semiconductors, high-temperature electronics and their reliability, coatings for high temperature applications, and factors affecting moisture diffusion in PCBs.

The event will be held at the National Physical Laboratory in Hampton Road, Teddington in London.

To register, click here.

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